Abstract

We present a model analysis for the current-voltage (I-V) characteristics of Josephson junctions having superconductor-insulator-superconductor (SIS) structure. The numerical result for the V m value, which is the product of the maximum supercurrent and the observed subgap resistance, shows a marked decrease with increasing junction critical current density (J c). The marked decrease is independent of leak current. Increasing J c reduces the junction capacitance C J and enlarges the amplitude of the junction voltage oscillation. Nonlinearity of the quasiparticle resistance restricts the voltage oscillation amplitude to the gap voltage, which results in the rapid decrease of the V m value. In this paper, we introduce a sinusoidal oscillation model for the junction voltage, and derive the approximated expressions for the V m value. The model approximation results agree well with the numerical results.

Full Text
Published version (Free)

Talk to us

Join us for a 30 min session where you can share your feedback and ask us any queries you have

Schedule a call