Abstract
AbstractIndium tin oxide (ITO) electrodes are widely used for liquid crystal applications as well as for measuring cells. Unfortunately, ITO layer possesses its own non zero resistivity R which produces (with the capacity C) the cut-off frequency f0 of RC circuit. Dielectric spectroscopy cannot be performed for high frequencies because of high frequency losses caused by the cell behaviour. Four procedures for estimating and extracting high frequency losses in ITO cells are presented and compared in this paper. Their limitations and viability are discussed.
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