Numerical Determination of Two-Port Parameters from Measured Unrestricted Data

Abstract

A procedure is developed for fitting a large (>3) number of arbitrarily chosen experimental data points to a fractional linear transformation on a complex plane. The transformation coefficients as well as their standard deviations are computed directly from the set of measured impedances or reflection coefficients, without any resort to graphical procedures. The procedure can be applied to linear reciprocal two-ports.