Numerical analysis on power loss mechanism of Fe55Al18O27 thin films for conduction noise through microstrip line

Abstract

With a simulation model of microstrip line attached by Fe55Al18O27 thin film of high magnetic loss, S parameters and power absorption has been analyzed by finite element method in the frequency range of available material parameters (0.1–1.5 GHz). It is demonstrated that the S parameters and power absorption are dominantly controlled by the electrical properties of the thin film. Although the film has a large value of magnetic loss resulting from ferromagnetic resonance, it is predicted that the power dissipation by magnetic loss is negligibly small. Simulation under assumption of high electrical resistivity shows that both S11 and S21 values approach to the value of original microstrip line. Another simulation of sheet resistance effect by film thickness control shows that higher value of power absorption is predicted in the films of small thickness mainly due to lower reflection loss. For the conductive and magnetic Fe55Al18O27 thin film, it is concluded that the dominant power loss mechanism is eddy current loss for magnetic field or Ohmic loss for electric field around the strip conductor in the frequency range investigated.