Abstract
A spectral analysis method has been recently introduced by Stark et al (2002 Proc. NatlAcad. Sci. USA 99 8473–8) and implemented by Sahin et al (2007 Nat. Nanotechnol. 2507–14) using a T-shaped cantilever design, the torsional harmonic cantilever(THC), which is capable of performing simultaneous tapping-mode atomic forcemicroscopy imaging and force spectroscopy. Here we report on numerical simulations ofthe THC system using a simple dual-mass flexural–torsional model, which isapplied in combination with Fourier data processing software to illustrate thespectroscopy process for quality factors corresponding to liquid, air and vacuumenvironments. We also illustrate the acquisition of enhanced topographical images anddeformed surface contours under the application of uniform forces, and compare theresults to those obtained with a previously reported linear dual-spring–mass model.
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