Abstract
Several misorientation parameters deduced or calculated from EBSD data can be used to follow the evolution of microstructure in deformation and recrystallization such as: BC (Band Contrast), GOS (Grain Orientation Spread), GND (Geometrically Necessary Dislocation density) and KAM (Kernel Average Misorientation). The KAM of a pixel is the mean value of misorientation between this pixel and its neighbors in a grid of (NxN) pixels in grain interior. In this work, we propose a modified KAM to characterize recrystallization in an IF steel, especially the nucleation stage. It is well known that nucleation starts in grains that have the highest stored energy of deformation, and then progresses in grains that have lower stored energy. The modified KAM value is quite sensitive to the state of the material. This presentation will discuss the relation between the modified KAM values, orientation gradients and the stored energy, as well as the possibility of using these values to identify nucleation sites.
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