Abstract
Thin fluorinated polymer films with thicknesses of about 300 nm were analyzed using the resonant nuclear reaction 19F(p, αγ) 16O. By tilting the samples, a depth resolution of 15 nm near the surface and 50 nm in a depth of 200 nm has been achieved. Due to the high detection efficiency of the γ-ray detector used, the measurements can be performed with low proton doses so that radiation damage is of minor influence. We are investigating the surface segregation of blends consisting of fluorinated and nonfluorinated polymers as well as the interdiffusion in bilayers of different polymers.
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