Abstract
The compositions of amorphous As2Se3 thin films modified with the Ln(thd)3 (Ln = Eu, Tb) complexes have been determined by nuclear microanalysis using deuterons provided by an electrostatic accelerator: Rutherford backscattering spectroscopy and nuclear reaction analysis. The rare-earth, oxygen, and carbon contents have been determined as functions of the initial concentration of the complex. The films have been also characterized by IR spectroscopy. Analysis of the nuclear microanalysis and IR spectroscopy results suggests that, in the modified films, the rare-earth atoms retain their local environment, in contrast to thin films of amorphous hydrogenated silicon.
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