Abstract
The interest in graphene is continuously rising among science communities. Applied physicists, new material designers, and nanotechnology engineers are attracted by its unique properties such as electrical and thermal conductivity. Fundamental physicists are enchanted by the possibility of exploring quantum relativistic phenomena on 2-dimensional crystals that have a unusual electronic spectrum. In order to manipulate a single-atom-thin structure, one needs a reliable high precision tool. In this article two experimental examples are presented. The first one shows the advantages of the NTEGRA based atomic force microscopy (AFM) and how it can reveal the fine structure of graphene flakes. The second example shows how the NTEGRA combines scanning probe microscopy (SPM) with the Raman spectroscopy to become a NanoLaboratory with advanced analytical capability.
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