Abstract

This paper presents a novel two‐dimensional (2‐D) defected ground array (DGA) for planar circuits, which has horizontal and vertical periodicities of defect structure. The defected unit cell of DGA is composed of a Sierpinski carpet structure to improve the effective inductance. Measurements show that the proposed DGA provides steeper cutoff characteristics, lower cutoff frequency, and higher slow‐wave factors than the conventional periodic defected ground structure in the same occupied surface.

Highlights

  • The rapid development of three-dimensional microwave integrated circuits (MICs), microwave monolithic integrated circuits (MMICs), and multiplayer-oriented low-temperature cofired-ceramic (LTCC) fabrication and processing techniques in recent years has led to great interest being directed towards the design of high-quality planar circuits [1, 2].Defected ground structure (DGS) for the microstrip line, which has etched defects in the backside metallic ground plane, is one recent hotspot of microwave circuit design [3, 4]

  • It is observed that the proposed defected ground array (DGA) has higher slow-wave factors than dumbbell DGS

  • A new 2-D DGA for planar circuits has been proposed in this paper, and has horizontal and vertical periodicities of defected structure

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Summary

INTRODUCTION

The rapid development of three-dimensional microwave integrated circuits (MICs), microwave monolithic integrated circuits (MMICs), and multiplayer-oriented low-temperature cofired-ceramic (LTCC) fabrication and processing techniques in recent years has led to great interest being directed towards the design of high-quality planar circuits [1, 2]. Compared to photonic bandgap (PBG) [5], DGS has a simple structure and potentially great applicability to design microwave circuits. Two of the most important characteristics of DGS are bandgap and high slow-wave effects, which are caused by the equivalent L-C components [3]. A novel two-dimensional (2-D) defected-ground array (DGA) for planar circuits is proposed. The proposed DGA is true 2-D structure which has vertical and horizontal periodicities of defected structure. It has more degrees of freedom in terms of dimensions than the previous 1-D DGS. Measurements show that more excellent bandgap characteristics and higher slow-wave factors can be obtained from the proposed DGA than the existing periodic DGS in the same occupied surface

FRACTAL DEFECTED GROUND STRUCTURE AND ITS CHARACTERISTICS
STRUCTURE OF DEFECTED-GROUND ARRAY
MEASURED RESULTS
CONCLUSIONS
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