Abstract
Tetra- and pentacoordinated sites are characterized in two titanium silicalites of MEL structure using XANES and EXAFS investigations at the Ti K-edge. A short Ti-Si distance of 2.19 ± 0.05 A in both samples is consistent with titanium [TiOx] units sharing edges with [SiO4] tetrahedral units. This result shows that titanium is located on a framework defect and not in a regular T site.
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