Novel Time-Saving Technique to Measure the 2D Complex Profile of Spectral Transmittance of Linearly Variable Filters and Assessing Homogeneity of Optically Transparent Materials

Abstract

Emerging technologies for coating new types of filters, such as linearly variable bandpass filters, urges new kind of measurement systems requiring accurate and time-saving spatially resolved transmittance measurements. On the other hand, one of the main uses of coated filters is standardization use; e.g., as certified reference materials (CRMs) for transmittance and absorbance standards. In this case, the homogeneity assessment is of great interest. To do such measurements with low uncertainty, spatial scanning methods using reference double-beam spectrophotometers are routinely used. High time consumption and relatively high-cost are disadvantages of this traditional method. In this work, we propose a new system based on an imaging technique. The newly developed system comprises a quartz tungsten halogen (QTH)-based illuminator, with collimator and coupling optics, a double-grating monochromator, customized integrating sphere, and scientific highly digitized, high-resolution and dynamic range Si-based CCD (monochrome) camera. The system is time-saving: in one-shot we may measure the spatial transmittance distribution of the samples (e.g. filters) without separately measuring the reference (air), which has many instability issues. Validation measurements using standard filters are presented. Systematic errors may be studied and corrected for. Many types of filters and liquids, for instance chemical reference materials (RMs), may be measured and reported. Uncertainty of spatial, spectral and radiometric components are studied carefully and estimated. The combined uncertainty evaluation has shown that relatively low uncertainty levels may be achieved, specially in the visible range (U < 1 %, k=2 ). Spatially-resolved data with different curves at different positions (spatial points) are shown in the spectral range of 380 nm through 950 nm. The combined uncertainties at some spectral points are presented and proved to be sample- and wavelength-dependent at all the points in the field-of-view (FOV) of the CCD camera.