Novel test pattern generators for pseudo-exhaustive testing

Abstract

Pseudo-exhaustive testing involves applying all possible input patterns to individual output cones of a circuit. The testing ensures detection of all combinational faults within individual cones. Test pattern generators based on coding theory principles are not tailored for circuit-under-test and generate inefficient pseudo-exhaustive test sets. We shall describe novel hardware efficient test pattern generators that employ knowledge of the circuit output cone structures for generating minimal test sets. Using our techniques, we have designed generators that generate minimum test sets for partitioned versions of the combinational benchmark circuits. >