Abstract
The difficulty in characterising nonlinear integrated structures lies in assessing the real power injected into the guided mode. Nonlinear characterisations of nano-waveguides currently reported in literature rarely give a precise determination of the coupling efficiency, while it directly affects the nonlinear response. Using a single beam top-hat Dispersive-Scan (D-Scan) method, a temporal analogue of the top-hat Z-Scan [1], we show the first nonlinear waveguide characterisation that simultaneously and accurately measures the input (k in ) and output (k out ) coupling efficiencies, the effective Two-Photon Absorption (γ TPA ) and Kerr (γ) nonlinear parameters. Like in Z-Scan, the D-Scan technique [2] advantageously gives access to the sign of the Kerr coefficient.
Sign-in/Register to access full text options 
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
