Abstract
A novel dielectric sensor technology has been developed for monitoring and control of plant nutrient delivery systems as part of NASA's Controlled Ecological Life Support System (CELSS) program. A unique measurement phenomenon was discovered in which the electrostatic field is shunted to a third terminal of the sensor, resulting in a much greater sensitivity to changes in the complex dielectric properties of the nutrient solution. Based on this phenomenon, a small, flexible, thin-film shunting dielectric sensor (SDS) was designed to provide low-frequency, non-invasive measurement of both the thickness and nutrient concentration of the layer of solution on a plant growth surface. Test results indicate a sensitivity of ±0.05mm in layer thickness while characterization of the ability to measure nutrient concentration continues. The development plan for this sensor is presented and other applications are discussed.
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