Abstract

A piezoresistive pressure sensor with multilayer SOI structures has been developed. First SOI layers were employed as an etch-stop layer. Double-heteroepitaxially grown second SOI layers were used as an electrically isolated strain gauge. This sensor has the advantages of high sensitivity and high temperature operation.

Full Text
Paper version not known

Talk to us

Join us for a 30 min session where you can share your feedback and ask us any queries you have

Schedule a call

Disclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.