Abstract
Novel instrumentation developments in X-ray spectroscopy for parallel spectral measurements with soft X-rays are described. The significant performance improvements are achieved utilising Fresnel diffraction from structures built onto the surface of a total external reflection mirror. An array of reflection zone plates was tested as a wavelength-dispersive fluorescence spectrometer for soft X-rays in the energy range of 100–550eV.
Sign-in/Register to access full text options 
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
