Abstract

The paper describes the design and the performance of an original p-channel JFET embedded in the collecting anode of a silicon radiation detector. The choice of a p-channel transistor, whose gate-to-channel junction is forward biased by the leakage current from the detector, avoids the preamplifier feedback resistor and performs a continuous dc reset of the collected charge. The reported design, fully compatible with the detector fabrication, makes the operation of the detector extremely simple, ensures the best charge collection capability and leads to improved charge resolution. The first detector produced with this type of transistor has a resolution of 27 electrons rms in the measurement of the collected charge at room temperature for a pixel active area of about 0.1 mm/sup 2/, and of 22 electrons rms at T=210 K. >

Full Text
Paper version not known

Talk to us

Join us for a 30 min session where you can share your feedback and ask us any queries you have

Schedule a call

Disclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.