Abstract
A novel method to determine the noise parameters of receivers or devices under test (DUTs) for on-wafer microwave noise measurements is presented. An iterative technique is utilized, and fast convergence is achieved by the proposed impedance selection principle. This proposed method reduces the parameter variations in the conventional methods. The impact of the impedance difference on noise parameter determination is experimentally evaluated using a DUT fabricated in a standard 90-nm CMOS technology.
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