Abstract
Soil pollution is predominantly attributed to the presence of heavy metal elements and organic compounds; However, current detection methodologies are restricted to the identification of only one of these two sources at a time. A novel analytical approach, known as nanoliter spray enhanced microwave plasma ionization mass spectrometry (Nano-Spray-EMPI-MS), has been developed to facilitate the simultaneous detection of both heavy metals and organic pollutants in soil samples. This technique is characterized by its requirement for minimal sample volumes, thereby allowing for efficient and rapid analysis. The research concentrated on the simultaneous analysis of five heavy metals (Pb, Zn, Cu, Cr, and Ni) and three major phthalates (PAEs), specifically DEHP, DBP, and DMP. The detection and quantification limits for the heavy metals were established to be between 0.16-0.57 and 0.53–1.88 μg L−1, respectively, while the limits for the PAEs ranged from 0.02 to 0.05 and 0.07–0.16 μg L−1. Validation of the method's efficacy in soil detection demonstrated recovery rates of 90.9 %–105.7 % for heavy metals and 89.4 %–97.2 % for PAEs. The application of this method analyzing soil samples collected from an area adjacent to a lead-acid battery industrial park in China revealed varying levels of contamination by both heavy metals and PAEs. Notably, Lead contamination was found to be the most pronounced, with a peak concentration of 862.5 mg kg−1 and a correspondingly high pollution index. These findings are significant for evaluating local ecological risks, pinpointing sources of pollution, and formulating effective pollution management strategies in the region.
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