Novel Methods for Bioimaging Including LA‐ICP‐MS , NanoSIMS , TEM / X‐EDS , and SXRF

Abstract

This chapter presents four complementary element-specific bioimaging techniques: laser ablation-inductively coupled plasma-mass spectrometry (LA-ICP-MS), nano secondary ion mass spectrometry (NanoSIMS), transmission electron microscopy coupled with energy-dispersive X-ray spectroscopy (TEM/X-EDS), and synchrotron-based X-ray fluorescence (SXRF). LA-ICP-MS is a spatially resolved analytical technique mainly measuring metallic elements in solidmaterials. LA-ICP-MS bioimaging analysis has been applied to cancer studies to investigate metal-ion distribution changes in diseased versus healthy tissues. SIMS is an analytical technique that relies on the sputtering of ions from a solid surface by focused positive or negative primary ion beams and the subsequent analysis of the produced secondary ions by a mass spectrometer under high vacuum. NanoSIMS and TEM/X-EDS are operated under high vacuum where the sample is exposed to a high-energy ion beam or electron beam. These facts demand specific sample preparation strategies for biological samples, which are similar for both techniques and can be regarded together.