Abstract
When an YBaCuO film is deposited onto a Nimonic 80A alloy substrate using a plasma technique there is extensive inter-reaction. The microstructural and compositional relationships between the layered products in this interfacial scaling process are described using data obtained by conventional edge-on TEM techniques. Our results demonstrate the way in which the segregation of chromium to the YBaCuO overlayer dominates the scaling behaviour that is seen, despite the formation of intermediate layers which would normally have been expected to act as diffusion barriers, and highlight the potential difficulties in making well behaved electrical contacts for this superconductor.
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