Abstract
The optical form birefringence in porous silicon films is measured by analyzing the transmitted interference intensity of a polarization interferometer. A novel form birefringence called boundary condition (BC) model for porous materials is introduced and evaluated experimentally against samples of porous silicon films. The variation of optical indexes of refraction vs the porosity in silicon films agrees with the calculated values of n/sub o//n/sub e/ within 1% error using the BC model, in contrast to the /spl sim/15% error using effective medium approximation model.
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
