Abstract
CdZnTe (CZT) micro pillar films with cubic zinc blend phase have been deposited on single layer graphene coated quartz substrate by close-spaced sublimation technique. Structural and phase purities of deposited micro pillar CZT films were investigated using X-ray diffraction and Raman spectroscopy. Scanning electron microscopy characterizations indicated that the diameters of CZT micro pillars were about 5 µm and their lengths were close to 57 µm. The band-gap of CZT micro pillar films was about 1.53 eV, which was confirmed by UV–Vis–NIR diffuse reflection spectra and PL spectra. The structure of Au/BGZO/CZT/graphene/quartz was fabricated to study its optoelectronic properties. Under the illumination of AM 1.5, CZT micro pillar films had good photo response, which indicated their great potential in the application of optoelectronic devices.
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