Abstract
Dual probe is capable of simultaneously measuring electric and magnetic fields in the same position, given that perfectly symmetric design is realized on the transmission paths connecting the detection loop and the probe outputs. For general application, a calibration method for the asymmetric probing in near-field measurement with the dual probe is presented, in order to deal with the failure of the traditional calibration due to the asymmetric transmissions in both paths. The asymmetric probing measurement is modeled, and then the proposed calibration to eliminate the asymmetry is further derived based on two independent measurements at two directions (0° and 90°) between the probe and the microstrip line providing a known electromagnetic field at the surface. The calibration method is demonstrated with two kinds of dual probes of different coupling structure. The proposed calibration is validated by introducing the asymmetry to the probing process in the measurement of the standing wave along a conductor-backed coplanar waveguide transmission line.
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