Abstract
A novel C60–DDME complex thin film was prepared by a new modified vacuum deposition technique. Stable and reproducible electrical bistable properties are observed in the C60–DDME thin films. The structure and spectroscopy characteristics of the complex C60–DDME thin film are considerably different from those of both DDME and C60 thin films, as is revealed by high resolution scanning electron microscopy, x-ray diffraction, and ultraviolet-visible absorption spectra.
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Schedule a callMore From: Journal of Vacuum Science & Technology B, Nanotechnology and Microelectronics: Materials, Processing, Measurement, and Phenomena
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