Abstract
A new ultra fast electron impact (El) ion source is presented that produces a very short, high intensity electron beam, allowing medium resolution mass spectra to be recorded without pulsing the ion accelerating voltages in a time-of-flight mass spectrometer (TOF-MS). The ion source requires minimum modification of any TOF-MS equipped with an electrostatic ion reflector and UV-laser. El-spectra are presented for comparison with literature spectra.
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