Note: Spring constant calibration of nanosurface-engineered atomic force microscopy cantilevers

Abstract

The determination of the dynamic spring constant (kd) of atomic force microscopy cantilevers is of crucial importance for converting cantilever deflection to accurate force data. Indeed, the non-destructive, fast, and accurate measurement method of the cantilever dynamic spring constant by Sader et al. [Rev. Sci. Instrum. 83, 103705 (2012)] is confirmed here for plane geometry but surface modified cantilevers. It is found that the measured spring constants (keff, the dynamic one kd), and the calculated (kd,1) are in good agreement within less than 10% error.