Abstract
The “constant-reflectivity” method for determining all the optical parameters of a system of an isotropic nonabsorbing film on an isotropic absorbing substrate using ellipsometry is examined. It is shown that this technique can only be considered for either very high or very low ratios of substrate extinction coefficient to substrate refractive index and even then caution must be exercised. This infers that the calculational method is very sensitive to the material involved.
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