Abstract
Notch sensitivity and defect sensitivity are two different aspects of the fatigue behavior of materials. The paper extends the Kitagawa diagram to blunt cracks (U-shaped notches) and presents the simple expression (a*/a0)0.5 = Kt. In such an expression a0 is the El-Haddad's length parameter and a* is a particular blunt crack depth corresponding to the intersection between the ΔKth and δσ0/Kt curves. The new expression provides an explicit bridging between the notch sensitivity and the sensitivity to defects.
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