Abstract
In this manuscript we propose a calculation method where the magneto-resistive elements are modelled as fluctuating resistances to correct the output voltage noise of magnetic tunnel junction (MTJ) from standard electronic circuits. This method is validated on single elements, partial and full Wheatstone bridge circuits, giving rise to a correction factor affecting the output voltage noise as well as sensitivity values. Combining the correction factor and a normalization by the number of MTJs pillars and the pillar surface, we show that the performances extracted by this method allow universal comparison between any results from literature.
Full Text 
Sign-in/Register to access full text options
Sign-in/Register to access full text options 
Published version (
Free)
Free) 
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a call
