Abstract
In this paper we present the experimental results on the temperature dependences of c-axis resistivity, (T), for epitaxial films of n-type superconductor Nd2–xCexCuO4+δ deposited on (110) SrTiO3 single crystal substrate in a wide range of Ce content from lightly to heavily substitution regions () under an optimal annealing. Alternative empirical models were used for a description of the observed semiconductor–like dependence. An excellent quantitative depiction of the experimental dependences turned out to be possible for all investigated samples in a model of natural superlattice with temperature - dependent barrier height.
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