Abstract
ErBa 2 Cu 3 O 7-x (EBCO) thin films on buffer layered Ni tapes were investigated via a sol-gel technique. Er-123 films were prepared using solutions of various Er, Ba, and Cu precursor organometallic compounds. NiO was grown on Ni tapes as a buffer layer. ESEM (environmental scanning electron microscope), EDS (energy dispersive spectroscopy), and XRD (X-ray diffraction) analysis were used to characterize the EBCO films. The films produced in this manner were homogeneous, and free of pinholes and cracks.
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