Abstract
A nonuniform sampling scheme for measuring the mutual intensity of the wavefield produced by an incoherent three-dimensional object is described. The scheme has application to imaging via coherence function measurements and to remote imaging via coherence function transfer. The nonuniform sampling grid is obtained through analysis of an extension of the van Cittert-Zernike relationship appropriate to spatially-limited three-dimensional objects. When compared to the uniform sampling case, a smaller number of measurements is required, and the minimum separation between measurement points is larger.
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