Abstract
A non-locally coded Fourier-transform ghost imaging (FGI) scheme and relevant coded phase retrieval method have been proposed to improve the image quality in ghost imaging. By inserting masks in the reference beam, the sample in the test beam is non-locally modulated, and coded Fourier-transform diffraction patterns of the sample are obtained via intensity correlation calculations between the two beams. Encoding and decoding procedures are incorporated in the phase retrieval process based on traditional hybrid input-output algorithm. Simulation and experiment results show that the spatial information of samples is successfully recovered from the coded diffraction patterns obtained using three masks, and the image quality is improved remarkably. If promoting this approach to x-ray FGI systems, it may realize high-resolution x-ray microscopy without increasing the sample's radiation damage.
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