Abstract
Herewith, we describe how intensity and phase of the ultrashort pulse retrieved with second-harmonic frequency-resolved optical gating (SHG FROG) can be utilized for measurement of the nonlinear refractive index (n2). Through comparison with available literature, we show that our method surpasses Z-scan in terms of precision by a factor of two, and thus, constitutes an interesting alternative. We present results for various materials: fused silica, calcite, YVO4, BiBO, CaF2, and YAG at 1030 nm. Unlike the Z-scan, the use of this method is not restricted to free-space geometry, but due to its characteristics, it can be used in integrated waveguides or photonic crystal fibers as well.
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