Nonlinear refractive index and multiphoton absorption measurements of wide bandgap semiconductors materials by femtosecond z-scan method

Abstract

We studied the nonlinear properties of some of the most promising nonlinear media for microelectronic applications - AlN and GaN. The nonlinear refractive index n2 and the multiphoton absorption ß of the media are measured by femtosecond z-scan method with virtual aperture.