Nonlinear rearrangement of the structure of domain walls in a thin magnetic film with a uniaxial in-plane anisotropy

Abstract

The structures of domain walls have been investigated by the method of three-dimensional computer simulation in films with uniaxial in-plane anisotropy at different film thicknesses. For the calculations, the parameters characteristic of permalloy films have been taken. It has been established that, depending on the film thickness, the walls that prove to be stable are one-dimensional Neel walls, cross-tie walls, and C- and S-shaped walls. Film thicknesses at which the transition between the different types of walls occurs have been determined. The structure of Bloch lines and Bloch points in C- and S-shaped walls has been investigated. The values of topological charges for different micromagnetic structures have been calculated.