Abstract
The thickness dependence of the nonlinear optical parameters of C 60-indopane Langmuir–Schaefer films in the range of 1–15 monolayers was studied by means of second harmonic generation (SHG) spectroscopy and interferometry. Both the spectral dependence of the SHG intensity and the relative-phase of the second harmonic (SH) wave was measured. The thickness dependence of the SHG parameters shows a regular behavior above 5 monolayers, being irregular for thinner films. The observed strong wavelength dependence of the SHG intensity is caused by near double (for the fundamental and SH waves) resonant conditions.
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