Nonlinear effects in superconducting thin film microwave resonators

Abstract

We discuss how reactive and dissipative nonlinearities affect the intrinsic response of superconducting thin-film resonators. We explain how most, if not all, of the complex phenomena commonly seen can be described by a model in which the underlying resonance is a single-pole Lorentzian, but whose centre frequency and quality factor change as external parameters, such as readout power and frequency, are varied. What is seen during a vector-network-analyser measurement is series of samples taken from an ideal Lorentzian that is shifting and spreading as the readout frequency is changed. According to this model, it is perfectly proper to refer to, and measure, the resonant frequency and quality factor of the underlying resonance, even though the swept-frequency curves appear highly distorted and hysteretic. In those cases where the resonance curve is highly distorted, the specific shape of the trajectory in the Argand plane gives valuable insights into the second-order physical processes present. We discuss the formulation and consequences of this approach in the case of nonlinear kinetic inductance, two-level-system loss, quasiparticle generation, and a generic model based on a power-law form. The generic model captures the key features of specific dissipative nonlinearities, but additionally leads to insights into how general dissipative processes create characteristic forms in the Argand plane. We provide detailed formulations in each case, and indicate how they lead to the wide variety of phenomena commonly seen in experimental data. We also explain how the properties of the underlying resonance can be extracted from this data. Overall, our paper provides a self-contained compendium of behaviour that will help practitioners interpret and determine important parameters from distorted swept-frequency measurements.