Abstract
We focus in this paper on the modeling and dynamical analysis of a tapping mode atomic force mi- croscopy (AFM) microcantilever beam. This latter is subjected to a harmonic excitation of its base displacement and to Van der Waals and DMT contact forces at its free end. For AFM design purposes, we derive a mathe- matical model for accurate description of the AFM microbeam dynamics. We solve the resulting equations of motions and associated boundary conditions using the Galerkin method. We find that using one-mode approxi- mation in tapping mode operating in the neighborhood of the contact region one-mode approximation may lead to erroneous results.
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
