Abstract
Magnetization induced optical second harmonic generation (MSHG) in combination with the magneto-optical Kerr effect (MOKE) was used to study thin Co films and Cu Co multilayers of thicknesses between 1 and 20 monolayers (ML) grown on a Cu(001) substrate. From the different dependence of MSHG and MOKE on Co film thickness we get direct information about the interface sensitivity of MSHG. Modifying the vacuum Co interface by gas adsorption yields the relative contributions of the vacuum Co and the Co Cu(001)- substrate interfaces. Both MSHG and MOKE data can be accurately described by a multiple reflection model.
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