Abstract
In this paper, we propose a non-invasive imaging method of microwave near field using a diamond containing nitrogen-vacancy centers. We applied synchronous pulsed sequence combined with charge coupled device camera to measure the amplitude of the microwave magnetic field. A full reconstruction formulation of the local field vector, including the amplitude and phase, is developed by measuring both left and right circular polarizations along the four nitrogen-vacancy axes. Compared to the raster scanning approach, the two dimensional imaging method is promising for application to circuit failure analysis. A diamond film with micrometer thinness enables high-resolution near field imaging. The proposed method is expected to have applications in monolithic-microwave-integrated circuit chip local diagnosis, antenna characterization, and field mode imaging of microwave cavities and waveguides.
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