Abstract

In recent years, the use of diffraction radiation (DR), emitted when a charged particle beam passes through a rectangular slit, has been proposed and successfully tested as a nonintercepting diagnostic of high brightness beams. However, some problems related to the control of the particle trajectory through the slit still remain. If an additional slit is placed in front of the first one, at a distance shorter than the radiation formation length, interference between the forward diffraction radiation from the upstream slit and the backward diffraction radiation from the downstream slit can be observed. In this paper we report the first experimental observation of this effect, which we call here optical diffraction radiation interference (ODRI). If the two slits have different dimensions and are not aligned on the same axis, the properties of the ODRI pattern can be effectively used for nonintercepting beam diagnostics, especially for the unambiguously determination of the beam size. Indeed, the advantage of ODRI compared with a single aperture DR screen is due to the reduction of synchrotron radiation background, the increase of sensitivity for transverse beam dimensions, and the possibility to separate effects caused by the beam size and by beam offset within the slit.

Highlights

  • Fourth generation free-electron laser (FEL) based light sources and future linac colliders demand high brightness electron beams

  • The advantage of optical diffraction radiation interference (ODRI) compared with a single aperture diffraction radiation (DR) screen is due to the reduction of synchrotron radiation background, the increase of sensitivity for transverse beam dimensions, and the possibility to separate effects caused by the beam size and by beam offset within the slit

  • We have presented the theory and the first nonintercepting beam size measurements using the method, which we call optical diffraction radiation interference (ODRI)

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Summary

Introduction

Fourth generation free-electron laser (FEL) based light sources and future linac colliders demand high brightness electron beams. Conventional diagnostic methods are based on the interaction of the electron beam with intercepting measurement devices. High brightness beams, due to their high power density, deposit into such an apparatus an unsustainable amount of energy leading to damage of the device. Developments of parasitic beam diagnostics methods are essential. The DR is emitted only when the dimension of the transverse electromagnetic field, at given wavelength and beam energy, is larger than the aperture size.

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