Abstract

The nonequilibrium phase transition of two-dimensional fully frustrated Josephson junction arrays driven by external currents is studied in the framework of the short-time dynamic scaling approach. Within the resistively shunted junction dynamics, besides the critical temperature ${T}_{c}$, the static and dynamic critical exponents $2\ensuremath{\beta}∕\ensuremath{\nu}$, $\ensuremath{\nu}$, and $z$ are obtained. The resulting values of ${T}_{c}$ are consistent with previous steady-state simulations and decrease with the increase of currents. It is found that the values of the exponent $\ensuremath{\nu}$ are not sensitive to external currents, while the values of $2\ensuremath{\beta}∕\ensuremath{\nu}$ and $z$ are strongly current dependent.

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