Abstract
We present an analytical study on the generation of broadband electromagnetic noise in solids as a consequence of variations in the dielectric constant under the impact of polarization induced by nonequilibrium thermodynamic fluctuations. The analysis leads to a specific formulation of the fluctuation dissipation theorem in the context of dielectric materials having finite electrodynamic boundary conditions, which drive energy into the system, under feedback, during its under interaction with a heat bath. The ensuing spectral symmetry breaking of the broadband noise yields bursts of narrowband signals, which can potentially result in phase transitions and dielectric breakdown. This study sheds a new light on high temperature precision calorimetry, while also improving our understanding of unexpected breakdowns in devices like CMOS components, capacitors and batteries.
Highlights
30 November 2017Original content from this work may be used under the terms of the Creative Abstract
Thermodynamic fluctuations are associated with the occurrence of noise in electronic devices, which is known as Nyquist–Johnson noise [1, 2]
The resultant voltage expressed by equation (24) expresses the response of interaction of an input voltage generated as a consequence of thermodynamic fluctuations to the macroscopic parameters of the dielectric material defined by its transfer function leading to an output voltage
Summary
Original content from this work may be used under the terms of the Creative Abstract. Any further distribution of consequence of variations in the dielectric constant under the impact of polarization induced by this work must maintain attribution to the nonequilibrium thermodynamic fluctuations. The analysis leads to a specific formulation of the author(s) and the title of the work, journal citation fluctuation dissipation theorem in the context of dielectric materials having finite electrodynamic and DOI. The ensuing spectral symmetry breaking of the broadband noise yields bursts of narrowband signals, which can potentially result in phase transitions and dielectric breakdown. This study sheds a new light on high temperature precision calorimetry, while improving our understanding of unexpected breakdowns in devices like CMOS components, capacitors and batteries
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