Abstract

In situ biaxial tensile tests were carried out on W/Cu nanocomposite thin films deposited on a polyimide cruciform substrate. A biaxial testing machine developed on the DiffAbs beamline at the French SOLEIL synchrotron allows for scrutinizing the mechanical behaviour of crystalline thin films at the micro-scale and the macro-scale using simultaneously synchrotron X-ray diffraction and digital image correlation techniques. Both strain analyses have been performed for two controlled non-equibiaxial loading paths: loading ratios of 0.8 and 0.33. The mechanical response is analysed and compared for the two loading ratios.

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