Abstract
Inelastic scattering of x-ray photons from standing-wave fields is used to measure nondiagonal elements of the dielectric-response matrix of Si. A peak-valley structure for q<Q c is found, due to the fact that bulk plasmon bands, split near the zone boundary, contribute with different signs; hence, direct evidence for the existence of plasmon bands is obtained. Such detailed studies of the response matrix, together with the proposed plasmon-band model, offer a new access to dynamical screening in an inhomogeneous electron system
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