Abstract

The application of thermal wave measurement techniques was demonstrated for Strontium Barium Niobate (SBN) and Lithium Tantalate (LT) crystals, Lead Zirconate Titanate (PZT) ceramics, and PZT thin films. We have investigated the influence of poling conditions and of chromium and cerium doping on the polarization distribution and domain wall pinning in SBN crystals, the impact of ion beam etching on the polarization distribution in high-detectivity LT infrared sensors, the influence of poling procedure on the polarization distribution of PZT piezoceramics, and the polarization distribution in self-polarized PZT thin films.

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