Abstract
A method has been developed for the precise nondestructive measurement of the dielectric constant and losses of slab-like samples such as microstrip substrates, for instance. Basically, the test setup consists of an open-ended rectangular waveguide, the flange of which is placed in contact with one side of the dielectric material, the other one being backed by a metal plate. The waveguide can be either simply cut at its end, or terminated by an inductive or capacitive iris. The reflection characteristics or the resonance parameters are related to the real and imaginary parts of the permittivity by means of computer-generated charts or an optimization program.
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callMore From: IEEE Transactions on Microwave Theory and Techniques
Disclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
